621.39 64660
Alford, Terry L. Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James Mayer. - [s. l.] : Springer verlag, c 2007 336p. 0-387-29260-8 Rs.4301.92 * Telecommunication. Communication engineering. * Feldman, C. * Title
Powered by Koha