620.00452 BAI 92243 92244 92245
Bain, Lee J. Statistical analysis of reliability and life testing models : theory and methods / by Lee J. Bain and Max Engelhardt. - 2nd. - New York : Marcel Dekker, 1991 vii, 496p.: ill.; 20cm 9780824785062 ?82.00 (Rs.8569.00) * EE * Engelhardt, Max * Title
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