Materials science in microelectronics II: the effects of structure on properties in thin films (Record no. 13787)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00524nam a2200181Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 160330s9999||||xx |||||||||||||| ||und|| |
| 020 ## - ISBN | |
| International Standard Book Number | 9780080446394 |
| -- | 25.00) Rs.12487.50 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | Central Library-NITS |
| 041 ## - Language | |
| Language | English |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Machlin, E.S. |
| 245 ## - TITLE STATEMENT | |
| Title | Materials science in microelectronics II: the effects of structure on properties in thin films |
| Statement of Resposibility | E.S. Machlin |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 2nd ed |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | Chennai |
| Name of publisher, distributor, etc | Elsevier |
| Date of publication, distribution, etc | 2006 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | x,255p.;23cm |
| 650 ## - Subject | |
| Subject | Physics |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| 521 ## - | |
| -- | TBS |
| Withdrawn status | Lost status | Damaged status | Not for loan | Location (home branch) | Sublocation or collection (holding branch) | Date acquired | Koha issues (times borrowed) | Barcode (Accession No.) | Koha date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|
| National Institute of Technology, Silchar | National Institute of Technology, Silchar | 03/30/2016 | 80787 | 03/30/2016 | 03/30/2016 | Books |
