Introduction to modern photogrammetry by Edward M. Makhail, James S. Bethel and J. Chris McGlone

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Material type: Text

TextLanguage: English Publication details: New York John Wiley and Sons 2001Description: ix,478p.:illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	526.982 MIK (Browse shelf(Opens below))	Available		59715

Includes index

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