VLSI Test principles and architectures :design for testability edited by Laung-terng Wang, Cheng-Wen Wu and Xiaoqing Wen
Material type: TextLanguage: English Series: The Morgan Kaufman series in systems on SiliconPublication details: New york Elsevier c2006Description: xxx, 777p. : illISBN:- 0-12-370597-5
- 621.395 VLS
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621.395 VLS VLSI handbook: silicon,gallium arsenide, and superconductor circuits | 621.395 VLS VLSI design methodologies for digital signal processing architectures | 621.395 VLS VLSI circuits and systems in silicon | 621.395 VLS VLSI Test principles and architectures :design for testability | 621.395 VLS VLSI technology | 621.395 VLS VLSI technology | 621.395 VLS VLSI technology |
Includes index
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