System-on-chip test architectures : Nanometer design for testability edited by Laung-Terng Wang, Charles E. Stroud and Nur A. Touba

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Material type: Text

TextLanguage: English Publication details: Amsterdam Elsevier 2008Description: xxxvi, 856pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	621.395 SYS (Browse shelf(Opens below))	Available		66332

Includes bibliographical references and index

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