Relibility of MEMS : Testing of materials and devices edited by Osamu Tabata and Toshiyuki Tsuchiya

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Material type: Text

TextLanguage: English Publication details: Wiley 2008Description: xx,303p.:illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	621/TAB (Browse shelf(Opens below))	Available		88478

includes index

RBC, New Delhi

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