Minimizing and exploiting leakage in VLSI design by Nikhil Jayakumar, Suganth Paul, Rajesh Garg, Kanupriya Gulati and Sunil P. Khatri

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Material type: Text

TextLanguage: English Publication details: New York Springer 2010Description: xxvii, 214p.:illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	621.395 / JAY (Browse shelf(Opens below))	Available		89283

Including Index

Sibyl, Kolkota

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