Semiconductor measurements and instrumentation by W. R. Runyan
Material type: TextLanguage: English Series: Texas instruments electronicsPublication details: Tokyo Mcgraw-Hill c1975Description: vii, 280p. : illISBN:- 0-07-054273-2
- 621.38152 RUN
Item type | Current library | Call number | Status | Date due | Barcode |
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Books | National Institute of Technology, Silchar | 621.38152 RUN (Browse shelf(Opens below)) | Available | 16401 | |
Books | National Institute of Technology, Silchar | 621.38152 RUN (Browse shelf(Opens below)) | Available | 14568 |
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621.38152 ROY Microwave semiconductor devices | 621.38152 ROY Microwave semiconductor devices | 621.38152 ROY Synthesis and characterization of II-VI semiconductor nanostructures for optoelectronic applications | 621.38152 RUN Semiconductor measurements and instrumentation | 621.38152 RUN Semiconductor measurements and instrumentation | 621.38152 RUT Solid-State electronics | 621.38152 RUT Solid- state electronics |
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