Fault-Tolerance and reliability techniques for high-density random-access memories by Kanad Chakraborty and Pinaki Mazumder

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TextLanguage: English Publication details: New Delhi Prentice-Hall c2002Edition: naDescription: xix, 426p. :illISBN:

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Holdings
Item type	Current library	Call number	Status	Barcode
Books	National Institute of Technology, Silchar	004.53 CHA (Browse shelf(Opens below))	Available	58569
Books	National Institute of Technology, Silchar	004.53 CHA (Browse shelf(Opens below))	Available	58570
Books	National Institute of Technology, Silchar	004.53 CHA (Browse shelf(Opens below))	Available	58571
Books	National Institute of Technology, Silchar	004.53 CHA (Browse shelf(Opens below))	Available	58572

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Previous	004.5 OSB Asborne 16-bit microprocessor handbook	004.53 BAI Memory management and multitasking beyond 640K	004.53 CHA Fault-Tolerance and reliability techniques for high-density random-access memories	004.53 CHA Fault-Tolerance and reliability techniques for high-density random-access memories	004.53 CHA Fault-Tolerance and reliability techniques for high-density random-access memories	004.53 CHA Fault-Tolerance and reliability techniques for high-density random-access memories	004.563 BIO Hard disk management: for the IBM PC, PS/2 and compatibles	Next

Includes bibliographical references and index.

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