Power-aware testing and test strategies for low power devices edited by Patrick Girard, Nicola Nicolici and Xiaoqing Wen

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Material type: Text

TextLanguage: English Publication details: New York Springer 2010Description: xxiii,363p.:illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	621.3815/GIR (Browse shelf(Opens below))	Available		85298
Books	National Institute of Technology, Silchar	621.3815/GIR (Browse shelf(Opens below))	Available		90446

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Previous	621.3815DAW Feedback linearization of RF power amplifiers	621.3815/DES Electronic devices & circuits : principles and applications	621.3815/GIR Power-aware testing and test strategies for low power devices	621.3815/GIR Power-aware testing and test strategies for low power devices	621.3815/GIR Power-aware testing and test strategies for low power devices	621.3815/IRW Engineering circuit analysis : International student version	621.3815/IRW Engineering circuit analysis : International student version	Next

includes index

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