Reliability and Statistical Variability analysis of Epitaxial Layer Based Tunnel FETs : a simulation study by Radhe Gobinda Debnath
Material type:![Mixed materials](/opac-tmpl/lib/famfamfam/MX.png)
- 621.38 DEB
Item type | Current library | Call number | Status | Date due | Barcode |
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National Institute of Technology, Silchar Central Library@NITS | 621.38 DEB (Browse shelf(Opens below)) | Available | TH461 |
National Institute of technology, Silchar Doctor of Philosophy (Ph.D.) 2023
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