Analog Validation, Characterization and Analysis of I/O Pad in Test Vehicle by Umakanta Padhan
Material type: MapLanguage: English Publication details: 2020 Silchar NIT Description: xi,60p;30cmSubject(s): DDC classification:- 621.39 PAD
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Dissertation | National Institute of Technology, Silchar Central Library@NITS | 621.39 PAD (Browse shelf(Opens below)) | Available | D1392 |
Browsing National Institute of Technology, Silchar shelves, Shelving location: Central Library@NITS Close shelf browser (Hides shelf browser)
National Institute of Technology, Silchar Master of Technology 2020
There are no comments on this title.