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Instrumentation, measurement and analysis by B C Nakra and K K Chaudhry
Material type:
TextLanguage: English Publication details: New Delhi Tata McGraw-Hill 2004Edition: 2nd edDescription: xiv, 632p. :illISBN: - 0-07-048296-9
- 681.2 NAK
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50662 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50672 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50671 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50670 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50669 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50668 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50667 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50666 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50665 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50664 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50663 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 36034 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Checked out | 10/20/2024 | 50661 |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50660 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50659 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 50658 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 41594 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 38460 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 38457 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 38456 | |
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National Institute of Technology, Silchar | 681.2 NAK (Browse shelf(Opens below)) | Available | 38452 |
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| 681.2 NAK Instrumentation, measurement and analysis | 681.2 NAK Instrumentation, measurement and analysis | 681.2 NAK Instrumentation, measurement and analysis | 681.2 NAK Instrumentation, measurement and analysis | 681.2 NAK Instrumentation, measurement and analysis | 681.2 NAK Instrumentation, measurement and analysis | 681.2 NAK Instrumentation, measurement and analysis |
Includes bibliographical references and index.
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