Terahertz metrology by Mira Naftaly
Material type: TextLanguage: English Publication details: Boston Artech House 2015Description: xx, 359pISBN:- 9781608077762
- 535.8 NAF
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Books | National Institute of Technology, Silchar Central Library@NITS | 535.8 NAF (Browse shelf(Opens below)) | Available | 108951 |
Browsing National Institute of Technology, Silchar shelves, Shelving location: Central Library@NITS Close shelf browser (Hides shelf browser)
535.2 RAM Optics | 535.35 UVV UV-VIS and photo luminescence spectroscopy for nanomaterials characterization | 535.35 UVV Nanostructures and thin films for multifunctional applications: technology, properties and devices | 535.8 NAF Terahertz metrology | 535.84 KUM Atomic and laser spectroscopy | 535.84 SPE Spectroscopy | 535.84 WHI Introduction to atomic spectra |
There are no comments on this title.