Trace analysis of atmospheric samples Kikuo Oikawa
Material type:
TextLanguage: English Publication details: New York John Wiley 1977Description: 158pSubject(s): DDC classification: - 628.53 OIK
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National Institute of Technology, Silchar | 628.53 OIK (Browse shelf(Opens below)) | Available | 9996 |
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| 628.53 KIL Elementary air survey | 628.53 KIL Elementary air survey | 628.53 MOW Air pollution and control | 628.53 OIK Trace analysis of atmospheric samples | 628.53 PER Air pollution | 628.53 SCH Air pollution control technology handbook | 628.53 TOX Toxic air pollutants from mobile sources:Emissions and health effects |
Includes index
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