Microstructural Characterization of Materials by David Brandon and Wayne D. Kaplan

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TextLanguage: English Publication details: New York Wiley–Blackwell 2008Edition: 2nd edDescription: xiv,536 pISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar Central Library@NITS	620.1 BRA (Browse shelf(Opens below))	Available		77766

Includes bibliographical references and index

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