Reliability and degradation semiconductor devices and circuits ed. by M.J. Howes and D.V. Morgan

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Material type: Text

TextLanguage: English Publication details: New York John Wiley & sons 1981Edition: naDescription: xii, 444p. :illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	621.38152 REL (Browse shelf(Opens below))	Available		13784

Includes bibliographical references and index.

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