Software reliability : measurement, prediction and application by John D. Musa, Anthony Iannino and Kazuhira Okumoto

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TextLanguage: English Series: McGraw-Hill series in software engineering and technologyPublication details: New York McGraw-Hill c1987Edition: naDescription: xvii, 621p.:illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	005.14 MUS (Browse shelf(Opens below))	Available		22657

Includes appendices and index

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