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LSI/ VLSI testability design by Frank F. Tsui
Material type:
TextLanguage: English Publication details: New York McGraw-Hill 1988Description: xv, 702p. :illISBN: - 0-07-100356-8
- 621.395 TSU
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National Institute of Technology, Silchar | 621.395 TSU (Browse shelf(Opens below)) | Available | 28665 |
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| 621.395 TOC Digital systems: principles and applicatons | 621.395 TOC Digital systems: principles and applications | 621.395 TOC Digital systems: principles and applications | 621.395 TSU LSI/ VLSI testability design | 621.395 ULL Computational aspects of VLSI | 621.395 ULT Ultra-low voltage nono-scale memories | 621.395 ULT Ultra-low voltage nono-scale memories |
Includes bibliographical references and index.
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