TY  - BOOK
AU  - Gtout, Ian A.
TI  - Integrated circuit test engineering: modern techniques
SN  - 1-84628-023-0
U1  - 621.381548 
PY  - 2006///
CY  - London
PB  - Springer
KW  - Digital logic test
KW  - Electronics
KW  - Integrated circuit
N1  - Includes bibliographical references and index
ER  -