TY  - BOOK
AU  - Miczo, Alexander
TI  - Digital logic testing and simulation
SN  - 0-471-43995-9
U1  - 621.381548 
PY  - 2003///
CY  - New Jersey
PB  - John Wiley
KW  - Automatic test pattern generation
KW  - Digital electronic- testing
KW  - Simulation
N1  - Includes bibliographical references and index; RBC
ER  -