TY  - GEN
AU  - Das, Debika
AU  - Chakraborty, Ujjal
TI  - Investigation on Reliability Issues of Bandgap and Gate Engineered TFETs and Its Application as Dielectric Modulated Biosensor

U1  - 621.38 
PY  - 2022///
KW  - Electronics and Communication Engineering
N1  - National Institute of technology, Silchar
ER  -