TY  - BOOK
AU  - Brandon,David
AU  - Kaplan, Wayne D
TI  - Microstructural Characterization of Materials
SN  - 9780470027844
U1  - 620.1 
PY  - 2008///
CY  - New York
PB  - Wiley–Blackwell
KW  -  Engineering Civil engineering
KW  - Materials of engineering and construction
N1  - Includes bibliographical references and index
ER  -