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Basic of x-ray diffraction and its applications By K. Ramakanth Hebbar
Material type:
TextLanguage: English Publication details: New Delhi I. K. International 2012Description: xvi, 257 p . ; 23cmISBN: - 9788189866075
- 537.53RAM
| Item type | Current library | Call number | Status | Date due | Barcode |
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Books
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National Institute of Technology, Silchar | 537.53RAM (Browse shelf(Opens below)) | Checked out | 03/04/2025 | 80980 |
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Books
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National Institute of Technology, Silchar | 537.53RAM (Browse shelf(Opens below)) | Available | 80981 | |
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Books
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National Institute of Technology, Silchar | 537.53RAM (Browse shelf(Opens below)) | Available | 80982 | |
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Books
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National Institute of Technology, Silchar | 537.53RAM (Browse shelf(Opens below)) | Available | 80983 | |
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Books
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National Institute of Technology, Silchar | 537.53RAM (Browse shelf(Opens below)) | Available | 80984 |
Includes index
P. T. Books International
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