Fatigue testing and analysis by Yung-Li Lee ...[et al.]

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Material type: Text

TextLanguage: English Publication details: Amsterdam Elsevier 2005Description: xiv, 402p. :illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	620.1126 FAT (Browse shelf(Opens below))	Available		54566

Includes bibliographical references and index.

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