Trace analysis of atmospheric samples Kikuo Oikawa
Material type: TextLanguage: English Publication details: New York John Wiley 1977Description: 158pSubject(s): DDC classification:- 628.53 OIK
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Books | National Institute of Technology, Silchar | 628.53 OIK (Browse shelf(Opens below)) | Available | 9996 |
Includes index
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