Your search returned 2 results.

Sort
Unhighlight Highlight
Select all Clear all
Select titles to:
Results
1.
Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James Mayer by
  • Alford, Terry L
  • Feldman, C
Material type: Text Text
Language: English
Publication details: [s. l.] Springer verlag c 2007
Availability: Items available for loan: National Institute of Technology, Silchar (1)Call number: 621.39 .

Place hold Add to cart
2.
No cover image available
Computer Systems Engineering Management by
  • Alford
Material type: Text Text
Language: English
Publication details: New York, NY Dekker, Marcel, Incorporated 11/1987
Availability: Items available for loan: National Institute of Technology, Silchar (1)Call number: 000.669 .

Place hold Add to cart
Pages
AVIOR TECHNOLOGIES PVT. LTD.
Phone no. 91-8017616701, Fax no. 91-XX-XXXX XXXX, sales@aviortechnologies.co.in


Visitor Counter

Powered by Koha