VLSI Test principles and architectures :design for testability edited by Laung-terng Wang, Cheng-Wen Wu and Xiaoqing Wen

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Material type: Text

TextLanguage: English Series: The Morgan Kaufman series in systems on SiliconPublication details: New york Elsevier c2006Description: xxx, 777p. : illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	621.395 VLS (Browse shelf(Opens below))	Available		64707

Includes index

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