| 000 | 00602nam a2200193Ia 4500 | ||
|---|---|---|---|
| 008 | 160330s9999||||xx |||||||||||||| ||und|| | ||
| 020 |
_a9781441909275 _cRs.9876.20, Rs.11309.25 |
||
| 040 | _aCentral Library-NITS | ||
| 041 | _aEnglish | ||
| 082 | _a621.3815/GIR | ||
| 245 |
_aPower-aware testing and test strategies for low power devices _cedited by Patrick Girard, Nicola Nicolici and Xiaoqing Wen |
||
| 260 |
_aNew York _bSpringer _c2010 |
||
| 300 | _axxiii,363p.:ill | ||
| 500 | _aincludes index | ||
| 521 | _bNBD, Guwahati | ||
| 650 | _aElectronics | ||
| 700 |
_aGirard, Patrick _4ed. |
||
| 942 | _cBK | ||
| 999 |
_c15096 _d15096 |
||