000			00667nam a2200229Ia 4500
008			160330s9999||||xx |||||||||||||| ||und||
020			_a0-471-43995-9 _cRs.5484.00
040			_aCentral Library-NITS
041			_aEnglish
082			_a621.381548 _bMIC
100			_aMiczo, Alexander
245			_aDigital logic testing and simulation _cby Alexander Miczo
250			_a2nd ed.
260			_aNew Jersey _bJohn Wiley _c2003
300			_axxii, 668p. :ill.
500			_aIncludes bibliographical references and index.
521			_bRBC
650			_aAutomatic test pattern generation
650			_aDigital electronic- testing
650			_aSimulation
942			_cBK
999			_c18909 _d18909