| 000 | 00672nam a2200217Ia 4500 | ||
|---|---|---|---|
| 008 | 160330s9999||||xx |||||||||||||| ||und|| | ||
| 020 |
_a9780824785062 _c?82.00 (Rs.8569.00) |
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| 040 | _aCentral Library-NITS | ||
| 041 | _aEnglish | ||
| 082 |
_a620.00452 _bBAI |
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| 100 | _aBain, Lee J. | ||
| 245 |
_aStatistical analysis of reliability and life testing models : theory and methods _cby Lee J. Bain and Max Engelhardt |
||
| 250 | _a2nd | ||
| 260 |
_aNew York _bMarcel Dekker _c1991 |
||
| 300 | _avii, 496p.: ill.; 20cm | ||
| 504 | _aIncludes bibliographical references and index | ||
| 521 | _bSBA, New Delhi | ||
| 650 | _aEE | ||
| 700 | _aEngelhardt, Max | ||
| 942 | _cBK | ||
| 999 |
_c21309 _d21309 |
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