| 000 | 00749nam a2200253Ia 4500 | ||
|---|---|---|---|
| 005 | 20250120161345.0 | ||
| 008 | 160330s9999||||xx |||||||||||||| ||und|| | ||
| 020 | _a9780387257426 | ||
| 040 | _aCentral Library-NITS | ||
| 041 | _aEnglish | ||
| 082 |
_a621.3815 _bKAB |
||
| 100 | _aKabisatpathy, Prithviraj | ||
| 245 |
_aFault diagnosis of analog integrated circuits _cby Prithviraj Kabisatpathy, Alok Barua, Satyabrato Sinha |
||
| 250 | _a1st ed. | ||
| 260 |
_aAmsterdam _c2006 |
||
| 300 | _aviii,271p.:ill. | ||
| 365 |
_b1190.00 _cRs. |
||
| 440 | _aFrontiers in Electronic Testing, 30 | ||
| 500 | _aIncludes index | ||
| 650 | _aECE | ||
| 650 | _aAnalog Integrated | ||
| 700 |
_4Auth. _aBarua, Alok _aSinha, Satyabrato |
||
| 942 | _cBK | ||
| 999 |
_c30661 _d30661 |
||