000			00593nam a2200205Ia 4500
008			160330s9999||||xx |||||||||||||| ||und||
020			_a0-07-100356-8
040			_aCentral Library-NITS
041			_aEnglish
082			_a621.395 _bTSU
100			_aTsui, Frank F.
245			_aLSI/ VLSI testability design _cby Frank F. Tsui
260			_aNew York _bMcGraw-Hill _c1988
300			_axv, 702p. :ill.
500			_aIncludes bibliographical references and index.
650			_aIntegrated circuits
650			_aMetal orcide semiconductor
650			_aVery large scale integation
942			_cBK
999			_c6070 _d6070