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Investigation on Reliability Issues of Bandgap and Gate Engineered TFETs and Its Application as Dielectric Modulated Biosensor

621.38
DAS

TH371

Das, Debika Investigation on Reliability Issues of Bandgap and Gate Engineered TFETs and Its Application as Dielectric Modulated Biosensor
/ by Debika Das. - , 2022
xxiii, 204p.;30cm * Electronics and Communication Engineering * Chakraborty, Ujjal * Title

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