Investigation on Reliability Issues of Bandgap and Gate Engineered TFETs and Its Application as Dielectric Modulated Biosensor (Record no. 25273)

MARC details
000 -LEADER
fixed length control field 00675npc a2200193Ia 4500
005 - DATE & TIME
control field 20230511122539.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160331s9999 xx 000 0 und d
040 ## - University/Facalty
Original cataloging agency Central Library-NITS
041 ## - Language
Language English
082 ## - DDC NUMBER
Classification number 621.38
Book Number DAS
100 ## - Personal Name
Personal name Das, Debika
245 ## - TITLE STATEMENT
Title Investigation on Reliability Issues of Bandgap and Gate Engineered TFETs and Its Application as Dielectric Modulated Biosensor<br/>
Statement of Resposibility by Debika Das
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Date of publication, distribution, etc 2022
300 ## - PHYSICAL DESCRIPTION
Collation xxiii, 204p.;30cm
502 ## - Dissertation Note
Dissertation Note National Institute of technology, Silchar
Degree Type Doctor of Philosophy (Ph.D.)
Year Degree Granted 2022
650 ## - Subject
Subject Electronics and Communication Engineering
700 ## - Added Entry Personal Name
Added Entry Personal Name Chakraborty, Ujjal
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Thesis
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Location (home branch) Sublocation or collection (holding branch) Shelving location Date acquired Koha issues (times borrowed) Koha full call number Barcode (Accession No.) Koha date last seen Price effective from Koha item type Nonpublic note (lost item payment)
    Dewey Decimal Classification     National Institute of Technology, Silchar National Institute of Technology, Silchar Central Library@NITS 05/11/2023   621.38 DAS TH371 05/11/2023 05/11/2023 Thesis  
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