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Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James Mayer
Material type:
TextLanguage: English Publication details: [s. l.] Springer verlag c 2007Description: 336pISBN: - 0-387-29260-8
- 621.39
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National Institute of Technology, Silchar | 621.39 (Browse shelf(Opens below)) | Available | 64660 |
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| 621.3897 FIT Transistor circuit analysis and design | 621.3897 FIT Transistor circuit analysis and design | 621.3897 FIT Transistor circuit analysis and design | 621.39 Fundamentals of nanoscale film analysis | 621.39 BAL Digital logic design principles | 621.39 BAL Digital logic design principles | 621.39 BAL Digital logic design principles |
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