Statistical analysis of reliability and life testing models : theory and methods by Lee J. Bain and Max Engelhardt

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Material type: Text

TextLanguage: English Publication details: New York Marcel Dekker 1991Edition: 2ndDescription: vii, 496p.: ill.; 20cmISBN:

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Holdings
Item type	Current library	Call number	Status	Barcode
Books	National Institute of Technology, Silchar	620.00452 BAI (Browse shelf(Opens below))	Available	92243
Books	National Institute of Technology, Silchar	620.00452 BAI (Browse shelf(Opens below))	Available	92244
Books	National Institute of Technology, Silchar	620.00452 BAI (Browse shelf(Opens below))	Available	92245

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Includes bibliographical references and index

SBA, New Delhi

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