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Statistical analysis of reliability and life testing models : theory and methods by Lee J. Bain and Max Engelhardt
Material type:
TextLanguage: English Publication details: New York Marcel Dekker 1991Edition: 2ndDescription: vii, 496p.: ill.; 20cmISBN: - 9780824785062
- 620.00452 BAI
| Item type | Current library | Call number | Status | Date due | Barcode |
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Books
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National Institute of Technology, Silchar | 620.00452 BAI (Browse shelf(Opens below)) | Available | 92243 | |
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Books
|
National Institute of Technology, Silchar | 620.00452 BAI (Browse shelf(Opens below)) | Available | 92244 | |
|
Books
|
National Institute of Technology, Silchar | 620.00452 BAI (Browse shelf(Opens below)) | Available | 92245 |
Includes bibliographical references and index
SBA, New Delhi
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