Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James Mayer

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Material type: Text

TextLanguage: English Publication details: [s. l.] Springer verlag c 2007Description: 336pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	621.39 (Browse shelf(Opens below))	Available		64660

Includes index

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