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Power-aware testing and test strategies for low power devices

621.3815/GIR

Power-aware testing and test strategies for low power devices / edited by Patrick Girard, Nicola Nicolici and Xiaoqing Wen. - New York : Springer, 2010
xxiii,363p.:ill includes index 9781441909275 Rs.9876.20, Rs.11309.25 * Electronics * Girard, Patrick , Ed. * Title

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