Power-aware testing and test strategies for low power devices (Record no. 15096)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00602nam a2200193Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 160330s9999||||xx |||||||||||||| ||und|| |
| 020 ## - ISBN | |
| International Standard Book Number | 9781441909275 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | Central Library-NITS |
| 041 ## - Language | |
| Language | English |
| 082 ## - DDC NUMBER | |
| Classification number | 621.3815/GIR |
| 245 ## - TITLE STATEMENT | |
| Title | Power-aware testing and test strategies for low power devices |
| Statement of Resposibility | edited by Patrick Girard, Nicola Nicolici and Xiaoqing Wen |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | New York |
| Name of publisher, distributor, etc | Springer |
| Date of publication, distribution, etc | 2010 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Pages | xxiii,363p.:ill |
| 500 ## - GENERAL NOTE | |
| General note | includes index |
| 650 ## - Subject | |
| Subject | Electronics |
| 700 ## - Added Entry Personal Name | |
| Added Entry Personal Name | Girard, Patrick |
| Relator code | Ed. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| 521 ## - | |
| -- | NBD, Guwahati |
| Withdrawn status | Lost status | Damaged status | Not for loan | Location (home branch) | Sublocation or collection (holding branch) | Date acquired | Koha issues (times borrowed) | Koha full call number | Koha date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|
| National Institute of Technology, Silchar | National Institute of Technology, Silchar | 03/30/2016 | 621.3815/GIR | 03/30/2016 | 03/30/2016 | Books |
