Power-aware testing and test strategies for low power devices edited by Patrick Girard, Nicola Nicolici and Xiaoqing Wen

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Material type: Text

TextLanguage: English Publication details: New York Springer 2010Description: xxiii,363p.:illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	National Institute of Technology, Silchar	621.3815/GIR (Browse shelf(Opens below))	Available

includes index

NBD, Guwahati

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