Investigation on Reliability Issues of Bandgap and Gate Engineered TFETs and Its Application as Dielectric Modulated Biosensor by Debika Das

By: Contributor(s): Material type: Mixed materialsMixed materialsLanguage: English Publication details: 2022Description: xxiii, 204p.;30cmSubject(s): DDC classification:
  • 621.38 DAS
Dissertation note: National Institute of technology, Silchar Doctor of Philosophy (Ph.D.) 2022
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Thesis Thesis National Institute of Technology, Silchar Central Library@NITS 621.38 DAS (Browse shelf(Opens below)) Available TH371

National Institute of technology, Silchar Doctor of Philosophy (Ph.D.) 2022

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